详细介绍
二碲化铌晶体 NbTe2(Niobium Selenide)
晶体尺寸:~8毫米
电学性能:金属,半导体(TC ~ 0.7k)
晶体结构:单斜晶系,C
晶胞参数:a=1.470 nm,b=0.364,c=0.935 nm,α=γ=90°,β=108°
晶体类型:合成
晶体纯度:>99.995%
X-ray diffraction on a NbTe2 single crystal aligned along the (101) plane. XRD was performed at room temperature using a D8 Venture Bruker. The 4 XRD peaks correspond, from left to right, to (h 0 l), with h = l = 1, 2, 3, 4
Powder X-ray diffraction (XRD) of a single crystal NbTe2. X-ray diffraction was performed at room temperature using a D8 Venture Bruker.
Stoichiometric analysis of a single crystal NbTe2 by Energy-dispersive X-ray spectroscopy (EDX).
Raman spectrum of a single crystal NbTe2. Measurement was performed with a 785 nm Raman system at room temperature.
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